METHOD FOR EXPANDING THE OBJECT BASE OF EXAMINATION BY STITCHING SOLUTIONS OF HIERARCHY ANALYSIS METHOD

Abstract

The paper presents the results on numerical modelling of the quality of opto-electronic detectors. In order to demonstrate a successful application of the proposed method of the object base extension, we use examples of hierarchy analysis of generalized quality index and integrated quality-price index. The proposed methodology allows reliable analysis the number of objects up to 21-24, that is enough for the most practical cases of examination